Industry Insights

What You Missed at OFC and Why You Needn’t Regret It

2020-04-15  |  8 min read 

Before OFC, we were more than excited to showcase a wealth of new Keysight products and solutions that will surely contribute in accelerating innovation for connecting and securing the world.

However, within the final days before the exhibition, the perspective all over the world changed dramatically and ‘We stay at home!’ became the order of the day to take responsibility for the wellbeing of others.

But there is no need to have regrets or feel like you missed out, as you are able to discover all of Keysight’s OFC offerings in this safe form at home and get a private demo right in front of you.

Study our All Our New Solutions in Detail.

Contact us to arrange your demo.

 

In Short: The Highlights We Wanted to Show at OFC

Fast, Efficient Wafer Level Test

We are exceptionally thrilled to announce Keysight’s latest unique innovation for integrated photonic testing, which combines wafer probing and measurement solutions for parametric testing with:

  • Automated wafer and die test workflow based on KS8400A Keysight PathWave test automation platform with integrated instrument and probe station control
  • Edge coupling on wafer and die-level and fully automated fiber-to-facet alignment

Keysight products included are: KS8400A TAP and plugins, N770010xC Photonic Application Suite, N4372E Lightwave Component Analyzer, 81606C Tunable Laser Source, N7745C Multiport Power Meter, N7786C Polarization Synthesizer, and the new M9601A PXIe source measure unit. The new N4372E Lightwave Component Analyzer addresses optoelectronic tests up to 110 GHz in an extended wavelength range down to 1260 nm. It also offers Rx test up to 110 GHz in the full 1260 – 1620 nm range, thanks to a transmitter that is calibrated traceable to NIST.

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Auxiliary chuck for calibration and single die testing suited for edge and surface probing

Auxiliary chuck for calibration and single die testing suited for edge and surface probing

 

Lightwave awarded N4891A 400GBASE FEC-Aware Receiver Test Solution

Based on the same platform as the A400GE-QDD, Keysight’s N4891A 400GE Layer 1 BERT QSFP-DD test system is used to characterize and quantify actual bit error ratio (BER) and forward error correction (FEC) performance. It also tests interconnect interoperability for all types of networking devices and equipment. This provides your development teams the test capabilities to quickly pinpoint problems and to validate and qualify excellent BER performance. Used in combination with the Keysight M8040A, the N4891A offers a unique 400GABASE FEC-aware Receiver Test Solution allowing measurement of frame loss ratio in 400G Ethernet links using FEC by supplying one stressed lane, while maintaining the proper FEC striped test pattern data. The test method is prescribed in the IEEE 802.3 standard clauses 121,122, 124 and 136, 137 and 138 (802.3bs and 802.3cd respectively). This solution provides unique insights to understand how component and system design tradeoffs are affected by FEC requirements and to predict the system margin under real conditions. This solution also supports both electrical and optical receiver stress testing (ORST).

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N4891A 400GBASE FEC-Aware Receiver Test Solution

N4891A 400GBASE FEC-Aware Receiver Test Solution

 

Coherent Terabit Research

The next generation coherent transceiver generation will operate at symbol rates around 100 GBd and beyond. Keysight offers a test solution that mimics the function of a coherent transceiver. It generates signals with flexible modulation formats for this speed class using our M8194A arbitrary waveform generator at up to 120 GSa/s on up to 4 channels and analyzes these signals with our groundbreaking N4391B optical modulation analyzer, based on our UXR real-time oscilloscope family. This solution enables full transceiver analysis at the new speed class to verify and improve their performance.

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N4391B 110 GHz Optical Modulation Analyzer

N4391B 110 GHz Optical Modulation Analyzer

 

High Frequency Parametric Testing for Silicon Photonics and Electro-Optic Device Testing

The N4372E 110GHz Lightwave Component Analyzer (LCA) extends Keysight’s LCA family for high frequency parametric testing of optical transmitters and receivers up to 110GHz. Based on the N5290A/N5291A 900 Hz to 110/120 GHz PNA MM-Wave System, the N4372E is the only electro-optic vector network analyzer system realizing both E-to-O and O-to-E S-Parameter measurements up to 110GHz.

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N4372E 110 GHz Lightwave Component Analyzer

N4372E 110 GHz Lightwave Component Analyzer

 

Parametric Photonic Test: New Generation of Fiberoptic Test Instruments: N77-C Family

Keysight supports you with a new integrated solution for measuring wavelength and polarization dependence of optical components. The new software and hardware use Keysight’s unique single-sweep method for the best repeatability. New polarization alignment and stabilized polarization sweeps are especially valuable for on-wafer and PIC testing, including probe alignment. Measurement and start-up times are greatly reduced.

For optical component development and manufacturing, these new tunable laser, optical power meter and polarization instruments provide the required functionality and accuracy with faster data transfer and easy connectivity.

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 N777-C Tunable Laser, N774-C Multiport Power Meter and N778-C Polarization Instrument Family

N777-C Tunable Laser, N774-C Multiport Power Meter and N778-C Polarization Instrument Family

 

Measure 100 GBd Signals

Keysight offers industry-leading signal generation (M8194A arbitrary waveform generator) and analysis (Infiniium UXR oscillocope) technology. The UXR is the first series of real-time oscilloscopes featuring ultra-low noise and high signal fidelity with 10 bits of high-definition resolution and four channels of simultaneous 13-110 GHz of bandwidth, each concurrently sampling at 256 GSa/s. It offers designers unparalleled insight into optical error detection, parametric test, and jitter decomposition with precision normally attributed to sampling instruments. The unique architecture of the UXR-Series oscilloscopes solved key equalization and clock recover challenges frequently encountered by 400G designers today.

The M8194A AWG provides the highest combination of speed (120 GSa/s), bandwidth (45 GHz typical to generate signals with frequency components up to 50 GHz, and channel density (1, 2, or 4 differential channels).

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M8194A 120 GSa/s Arbitrary Waveform Generator

 

Customized KeysightCare

KeysightCare redefines best-in-class for customer care in test and measurement, offering dedicated, proactive support through a single point of contact for instruments, software, and solutions. Get faster response times, faster access to specialized experts, and faster time to resolution. Beyond KeysightCare, we offer broad services that help you get more from your test investment, including Calibration/Repair, Used Equipment, Technology Refresh, Consulting, Training, Financial Services, and Test-as-a-Service.

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Keysight Care Support Details